The Tek Pulse: The latest and greatest engineering and science posts

July 15, 2016 Tektronix Experts

 

Informative, innovative and interesting articles from our favorite blogs

 

 

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The growth in datacom is impacting IEEE & OIF test strategies
The growth in datacom is impacting IEEE & OIF test strategies

  By Chris Loberg, Sr. Manager, Performance Instruments Classifications ...

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Power Supply Measurement Tips, Part 9 of 10: EMI Troubleshooting and Pre-compliance
Power Supply Measurement Tips, Part 9 of 10: EMI Troubleshooting and Pre-compliance

In part 9 of our 10-part series on designing a power supply, we’re focusing on EMI and RFI testing. This st...

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