Kirchhoff’s Law saves the day when you need more power!

April 18, 2016 Tektronix Experts

You’re designing a new device/component and you just realized that the source measure unit (SMU) instrument that you have been using to perform I-V characterization doesn’t have enough power to test your new device. How are you going to get the job done? You may think you are out of luck if your test requirements exceed the power envelope of your SMU instruments, but it is possible to combine two SMUs in series or parallel to extend their combined DC operating range to meet the needs of your test application.

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